U.S. Department of Energy

Pacific Northwest National Laboratory

Learning Nanomaterial Processes from Big Image Data

Friday, May 19, 2017
Dr. Chiwoo Park
Assistant Professor, Department of Industrial and Manufacturing Engineering
Florida State University
Nanomaterials are characterized by their nanoscale dimensions which often determine the properties of nanomaterials. Therefore, by simply changing the dimensions, one can produce new functional materials. However, precise control of nanoscale dimensions in a nanomaterial synthesis process is very challenging because the underlying mechanism of the dimension changing process is not well understood. Recently, in situ electron microscopy has shown promise for direct, real-time imaging of the process. The issue still remains of how to analyze a large volume of microscope image data to track down individual events in time lapsed images and understand their effect on macroscopic dimension changes of nanomaterials over time. In this talk, we discuss related research issues and present a big data framework that addresses the issues, including in-line image understanding, real-time event tracking, and longitudinal and cross sectional analysis of the events over time.
Speaker Bio

Dr. Chiwoo Park received his B.S. in industrial engineering at Seoul National University and Ph.D. in industrial engineering at Texas A&M University. He is an Assistant Professor, Department of Industrial and Manufacturing Engineering, at Florida State University and a principal investigator at the High Performance Material Institute. His research interest is in data analytics, especially applied to nanoscience and manufacturing engineering. His work is supported by the National Science Foundation and the Air Force Office of Scientific Research. He has received the best student paper award at the IEEE Conference on Automation Science and Engineering, the Ralph E. Powe Junior Faculty Award from the Oak Ridge Associated Universities, and the IIE best application paper. He is an active member of IIE, IEEE, and INFORMS, and a council member of the QSR Section of INFORMS.

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